Indonesia Conference Directory

Sweet corn (Zea mays var Saccharata) is the result of a recessive mutation that occurs naturally in genes that control the conversion of sugar into starch in corn endosperm. Three main genes affect the sweetness of corn, namely the sugary gene (su), the sugary enhancer gene (se), and the shrunken gene (sh2). Downy mildew is a major disease in corn and can cause yield losses until 100% if it infects resistance plants at 10-15 days after planting. The purpose of this study was to obtain information on the character of growth, yield components and downy mildew disease resistance on some sweet corn lines in the S-3 generation. The study was conducted on July 2019 until October 2019 in Wedomartani Experimental Garden, Faculty of Agriculture, UPN Veteran Yogyakarta. The seven pure line were used: BFa, BFb, BFc, BFd, BFe, BFf, and BFg by using a Randomized Block Design with 3 Blocks. Planting in each experimental unit consists of 3 rows, each row consisting of 20 plants. The growth properties that were observed is plant height, stem diameter and number of leaves. The yield components that were observed is the number of cob, the length of the cob and the diameter of the cob. The plant disease resistance variables were the number of infected plants, the number of live plants and disease incidence. Data were analyzed by analysis of variance with 5% significance, followed by Duncans multiple range test with a level of 5%. The results showed that there was no difference on all line used. In the yield component the results show that lines that have largest lengths are BFa, BFe, BFf, and BFg. All line have largest diameter of the cobs except BFg. BFc, BFd, BFe, BFb, and BFg have high resistance on corn downy mildew.